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Synthesis and Characterization of Molybdenum Doped ZnO Thin Films by SILAR Deposition Method

R. Radha, A. Sakthivelu, D. Pradhabhan
DOI: http://dx.doi.org/10.21013/jas.v4.n1.p10
Abstract
Molybdenum (Mo) doped zinc oxide (ZnO) thin films were deposited on the glass substrate by Successive Ionic Layer Adsorption and Reaction (SILAR) deposition method. The effect of Mo dopant concentration of 5, 6.6 and 10 mol% on the structural, morphological, optical and electrical properties of n-type Mo doped ZnO films was studied. The X-ray diffraction (XRD) results confirmed that the Mo doped ZnO thin films were polycrystalline with wurtzite structure. The field emission scanning electron microscopy (FESEM) studies shows that the surface morphology of the films changes with Mo doping. A blue shift of the optical band gap was observed in the optical studies. Effect of Mo dopant concentration on electrical conductivity was studied and it shows comparatively high electrical conductivity at 10 mol% of Mo doping concentration. 
Keywords
SILAR, ZnO thin films, Mo- doping, surface morphology, electrical properties
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